Testing an electron beam deflection innovation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4510, Issue , 2001, Pages 196-204

  Retsky, Michael ^a  

^a Electron Optics Development Co LLC   (United States)

Author keywords

Electric deflection aberration CRT Energy consumption mammography workstation display

Indexed keywords

ABERRATIONS; CATHODE RAY TUBES; ELECTRIC SPACE CHARGE; ENERGY UTILIZATION; MAMMOGRAPHY;

ELECTRON BEAM DEFLECTION;

ELECTRON BEAMS;

EID: 0035767068     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451282     Document Type: Conference Paper

References (17)

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