Evidence for dislocations or related defects present in CdTe and Cd1-xZnxTe crystals

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4507, Issue , 2001, Pages 264-272

  Awadalla, Salah A ^a   Hunt, Alan W ^a   Tjossem, Russell B ^a   Lynn, Kelvin G ^a   Szeles, Csaba ^b   Bliss, Mary ^c  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b II VI Inc   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Cd1 xZnxTe; CdTe; Dislocation; Intrinsic defects; TEES

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); ELECTRIC CURRENT MEASUREMENT; HEATING; INGOTS; IONIZATION; SPECTROSCOPIC ANALYSIS; THERMOELECTRICITY;

THERMOELECTRIC EFFECT SPECTROSCOPY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0035767036     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450770     Document Type: Article

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