-
1
-
-
85062303208
-
Optical performance for MEMS-scanner based microdisplays
-
Santa Clara, CA, Sep
-
Urey, H.; Wine, D.; Osborn, T. Optical performance for MEMS-scanner based microdisplays. In MOEMS and Miniaturized Systems, Proc. SPIE vol. 4178, Santa Clara, CA, Sep 2000, 176-185.
-
(2000)
MOEMS and Miniaturized Systems, Proc. SPIE
, vol.4178
, pp. 176-185
-
-
Urey, H.1
Wine, D.2
Osborn, T.3
-
2
-
-
0033608016
-
Scanner design and resolution tradeoffs for miniature scanning displays
-
San Jose, CA, Jan
-
Urey, H.; Wine, D.W.; Lewis, J.R. Scanner design and resolution tradeoffs for miniature scanning displays. In Flat Panel Display Technology and Display Metrology, Proc. SPIE vol. 3636, San Jose, CA, Jan. 1998; 60-68.
-
(1998)
Flat Panel Display Technology and Display Metrology, Proc. SPIE
, vol.3636
, pp. 60-68
-
-
Urey, H.1
Wine, D.W.2
Lewis, J.R.3
-
3
-
-
1542302948
-
Dynamic deformation of scanning micromirrors
-
Kauai, Hawaii
-
R. Conant, J. Nee, K. Lau, R. Muller, "Dynamic Deformation of Scanning Micromirrors," IEEE/LEOS Optical MEMS 2000, Kauai, Hawaii, pgs 49-50.
-
IEEE/LEOS Optical MEMS 2000
, pp. 49-50
-
-
Conant, R.1
Nee, J.2
Lau, K.3
Muller, R.4
-
4
-
-
0018495699
-
Stroboscopic interferometer
-
J.S. Harris, R.L. Fusek and J.S. Marcheski, "Stroboscopic interferometer", Applied Optics, 18, 2368-2371, 1979
-
(1979)
Applied Optics
, vol.18
, pp. 2368-2371
-
-
Harris, J.S.1
Fusek, R.L.2
Marcheski, J.S.3
-
5
-
-
0003333241
-
Wavefront sensors for control and process monitoring in optics manufacture
-
D. R. Neal, D. J. Armstrong and W. T. Turner, "Wavefront sensors for control and process monitoring in optics manufacture," SPIE 2993 (1997)
-
(1997)
SPIE
, vol.2993
-
-
Neal, D.R.1
Armstrong, D.J.2
Turner, W.T.3
-
6
-
-
85077782675
-
Amplitude and phase beam characterization using a two-dimensional wavefront sensor
-
D. R. Neal, W. J. Alford, and J. K. Gruetzner, "Amplitude and phase beam characterization using a two-dimensional wavefront sensor," SPIE Vol. 2870, pp. 72-82 (1996).
-
(1996)
SPIE
, vol.2870
, pp. 72-82
-
-
Neal, D.R.1
Alford, W.J.2
Gruetzner, J.K.3
-
7
-
-
0019045493
-
Wave-front estimation from wave-front slope measurement
-
(August)
-
W. H. Southwell, "Wave-front estimation from wave-front slope measurements," J. Opt. Soc. Am., Vol. 70, No. 8 (August, 1980).
-
(1980)
J. Opt. Soc. Am.
, vol.70
, Issue.8
-
-
Southwell, W.H.1
-
8
-
-
0028750694
-
Observations of faint objects with laser beacon adaptive optics
-
R. Q. Fugate, "Observations of faint objects with laser beacon adaptive optics," SPIE Vol. 2201, pp. 10-21 (1994).
-
(1994)
SPIE
, vol.2201
, pp. 10-21
-
-
Fugate, R.Q.1
-
9
-
-
0027849974
-
Wavefront sensors for optical diagnostics in fluid mechanics: Application to heated flow, turbulence and droplet evaporation
-
D. R. Neal, T.J. O'Hern, J.R. Torczynski, M.E. Warren, and R. Shul, "Wavefront sensors for optical diagnostics in fluid mechanics: Application to heated flow, turbulence and droplet evaporation," SPIE Vol. 2005, pp. 194-203 (1993).
-
(1993)
SPIE
, vol.2005
, pp. 194-203
-
-
Neal, D.R.1
O'Hern, T.J.2
Torczynski, J.R.3
Warren, M.E.4
Shul, R.5
-
10
-
-
85077782675
-
Amplitude and phase beam characterization using a two-dimensional wavefront sensor
-
D. R. Neal, W. J. Alford, and J. K. Gruetzner, "Amplitude and phase beam characterization using a two-dimensional wavefront sensor," SPIE Vol. 2870, pp. 72-82 (1996).
-
(1996)
SPIE
, vol.2870
, pp. 72-82
-
-
Neal, D.R.1
Alford, W.J.2
Gruetzner, J.K.3
-
11
-
-
0010916314
-
Wavefront sensor testing in hypersonic flows using a laser-spark guide star
-
D. R. Neal, D. J. Armstrong, E. Hedlund, M. Lederer, A. Collier, C. Spring, J. Gruetzner, G. Hebner and J. Mansell, "Wavefront sensor testing in hypersonic flows using a laser-spark guide star," SPIE Vol. 3172-36 (1997).
-
(1997)
SPIE
, vol.3172
, Issue.36
-
-
Neal, D.R.1
Armstrong, D.J.2
Hedlund, E.3
Lederer, M.4
Collier, A.5
Spring, C.6
Gruetzner, J.7
Hebner, G.8
Mansell, J.9
-
12
-
-
0003333241
-
Wavefront sensors for control and process monitoring in optics manufacture
-
D. R. Neal, D. J. Armstrong and W. T. Turner, "Wavefront sensors for control and process monitoring in optics manufacture," SPIE 2993 (1997)
-
(1997)
SPIE
, vol.2993
-
-
Neal, D.R.1
Armstrong, D.J.2
Turner, W.T.3
-
13
-
-
0003458638
-
Interferogram analysis for optical testing
-
Marcel Dekker, Inc, New York, NY
-
D. Malacara, M. Servin, and Z. Malacara, "Interferogram analysis for optical testing", pg 299-300 Marcel Dekker, Inc, New York, NY, 1998
-
(1998)
, pp. 299-300
-
-
Malacara, D.1
Servin, M.2
Malacara, Z.3
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