New capabilities and applications of compact source-optic combinations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4502, Issue , 2001, Pages 134-147

  Bievenue, T ^a   Burdett, J ^a   Chen, Z W ^a   Gao, N ^a   Gibson, D M ^a   Gibson, W M ^a   Huang, H ^a   Ponomarev, I Y ^a  

^a X ray Optical Systems   (United States)

Author keywords

Doubly curved crystal; MXRF; Polycapillary; X ray optics; X ray sensors; XRD

Indexed keywords

CAPILLARITY; CRYSTAL LATTICES; DIFFRACTOMETERS; INDUSTRIAL APPLICATIONS; SENSORS; SPECTROMETERS; X RAY APPARATUS; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION ANALYSIS;

POLYCAPILLARY CRYSTAL OPTICS; X-RAY OPTICAL SYSTEMS (XOS);

X RAY OPTICS;

EID: 0035762383     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.449854     Document Type: Article

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