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Volumn 33, Issue 2, 2000, Pages 389-391

Parallel-beam X-ray diffractometry using X-ray guide tubes

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; ORIENTATION; PARTICLE SIZE; STRUCTURE ANALYSIS; TUBE; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0034480426     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899015344     Document Type: Article
Times cited : (10)

References (12)
  • 7
    • 33847595285 scopus 로고
    • Japan Patent No. 1828290
    • Nakazawa, H. & Nozaki, H. (1985). Japan Patent No. 1828290.
    • (1985)
    • Nakazawa, H.1    Nozaki, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.