Optical near-field phase singularities produced by microstructures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4456, Issue , 2001, Pages 68-77

  Nesci, A ^a   Dandliker R ^a   Salt, M ^a   Herzig, H P ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

Heterodyne detection; Near field optics; Phase singularities; Scanning probe optical microscope; Talbot effect

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; HETERODYNING; LIGHT POLARIZATION; MICROSTRUCTURE; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; OPTICS; PROBES;

FOURIER MODAL METHOD; HETERODYNE DETECTION; NEAR FIELD OPTICS; OPTICAL NEAR FIELD PHASE SINGULARITIES; SCANNING PROBE OPTICAL MICROSCOPE; TALBOT EFFECTS;

ELECTROMAGNETIC FIELDS;

EID: 0035761819     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.449524     Document Type: Conference Paper

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