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Volumn 4417, Issue , 2001, Pages 267-270

Deep reactive ion etching of silica for planar lightwave circuits using indigenously developed ECR/RIE system

Author keywords

Electron Cyclotron Resonance; Planar Lightwave circuits; Reactive Ion Etching; Silica Glass Film; Splitter

Indexed keywords

ELECTRON CYCLOTRON RESONANCE; FLUOROCARBONS; OPTICAL FIBERS; OPTICAL WAVEGUIDES; OPTIMIZATION; REACTIVE ION ETCHING; SILICA;

EID: 0035759756     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.441305     Document Type: Article
Times cited : (1)

References (8)
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  • 2
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    • Multipole confined diffusion plasma produced by 13.56 Mhz electrodeless source
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    • Measurements of rf bias effects in a dual electron cyclotron resonance- rf methane plasma using the langmuir probe method
    • J. Hong, A. Granier, C. Leteinturier, M.C. Peginon, "Measurements of rf bias effects in a dual electron cyclotron resonance- rf methane plasma using the langmuir probe method', J. Vac. Sci. Technolog. A 18(2), (2000), p 497-502.
    • (2000) J. Vac. Sci. Technolog. A , vol.18 , Issue.2 , pp. 497-502
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.