Target recognition performance as a function of sampling

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4372, Issue , 2001, Pages 74-84

  Devitt, Nicole ^a   Driggers, Ronald G ^a   Vollmerhausen, Rich ^a   Moyer, Steve ^a   Krapels, Keith ^a   O'Connor, John ^a  

^a NIGHT VISION AND ELECTRONIC SENSORS DIRECTORATE   (United States)

Author keywords

Electro Optics Performance Modeling; Sampling; Target Acquisition

Indexed keywords

ARMOR; DATA ACQUISITION; ELECTROOPTICAL DEVICES; IMAGE SENSORS; PERFORMANCE; SAMPLING;

RECOGNITION PERFORMANCE;

RADAR TARGET RECOGNITION;

EID: 0035759139     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.439142     Document Type: Conference Paper

References (10)

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8. R. H. Vollmerhausen and R. G. Driggers, Analysis of Sampled Imaging Systems, SPIE Tutorial Texts in Optical Engineering Volume TT39, SPIE Press, Bellingham, WA, March 2000.
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10. Steve Moyer, Ronald G. Driggers, Rich Vollmerhausen, and Keith Krapels, "Target Identification Performance as a Function of Spurious Response: Aliasing With Respect to the Half Sample Rate," SPIE Proceedings, Aerosense Orlando, April, 2001.