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Volumn 47, Issue 1, 2000, Pages 160-170
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MOSFET channel length: extraction and interpretation
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CAPACITANCE MEASUREMENT;
CARRIER MOBILITY;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC RESISTANCE;
GATES (TRANSISTOR);
MASKS;
MATHEMATICAL MODELS;
SEMICONDUCTOR DOPING;
THRESHOLD VOLTAGE;
VOLTAGE MEASUREMENT;
CHANNEL LENGTH;
SHORT CHANNEL EFFECT;
MOSFET DEVICES;
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EID: 0033894377
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.817582 Document Type: Article |
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Times cited : (88)
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References (27)
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