A novel shadow-imaging technique to measure charge distribution and lattice displacement

Journal of Electron Microscopy

Volumn 50, Issue 6, 2001, Pages 465-471

  Zhu, Yimei ^a   Wu, Lijun ^a   Tafto, Johan ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

High temperature superconductors; Measurements of charge distribution and interfacial displacement; Quantitative electron diffraction; Shadow imaging

Indexed keywords

CONFERENCE PAPER;

BISMUTH COMPOUNDS; CALCIUM COMPOUNDS; CHARGE DISTRIBUTION; COPPER COMPOUNDS; STRONTIUM COMPOUNDS;

COHERENT SOURCES; DIFFRACTION INTENSITY; DIFFRACTION TECHNIQUES; HIGH-TEMPERATURE SUPERCONDUCTOR; LATTICE DISPLACEMENT; MEASUREMENT OF CHARGE DISTRIBUTION AND INTERFACIAL DISPLACEMENT; MEASUREMENTS OF; PARALLEL RECORDING; QUANTITATIVE ELECTRON DIFFRACTION; SHADOW IMAGING;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0035724531     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.6.465     Document Type: Conference Paper

References (9)

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