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Volumn 40, Issue 12, 2001, Pages 2852-2859

Optical profilometer with a standalone scanning sensor head

Author keywords

Metrology; Nondestructive testing; Optical inspection; Optical systems; Optoelectronics; Optomechanical design; Profilometry; Sensors

Indexed keywords

ACTUATORS; COMPACT DISKS; OPTICAL SENSORS; OPTICAL SYSTEMS; PROFILOMETRY; REMOTE CONTROL; SCANNING;

EID: 0035721301     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1417494     Document Type: Article
Times cited : (8)

References (18)
  • 18
    • 0001761167 scopus 로고    scopus 로고
    • Influence of substrate thickness on optical disk readout
    • (1997) Appl. Opt. , vol.36 , pp. 8056-8062
    • Braat, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.