Device simulation of generation-recombination noise under periodic large-signal conditions

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2001, Pages 477-480

  Sanchez, Juan E ^a   Bosman, Gijs ^a   Law, Mark E ^a  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; MATHEMATICAL MODELS; NUMERICAL METHODS; PARTIAL DIFFERENTIAL EQUATIONS; POISSON EQUATION; RESISTORS; SPURIOUS SIGNAL NOISE;

ELECTRON CONTINUITY EQUATION; FLICKER NOISE; GENERATION RECOMBINATION NOISE; HARMONIC BALANCE METHOD; HOLE CONTINUITY EQUATION; IMPEDANCE FIELD METHOD; SEMICONDUCTOR DEVICE SIMULATOR;

SEMICONDUCTOR JUNCTIONS;

EID: 0035714289     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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5. Influence of lattice self-heating and hot-carrier transport on device performance
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8. Analysis of thermal and shot noise in pumped resistive diodes
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13. +/n silicon junction diodes