Dielectric investigation of [(SrTiO3)6(BaTiO3)6]2 multilayer capacitor

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 12, 2001, Pages 6888-6892

  Yoneda, Yasuhiro ^a,b   Sakaue, Kiyoshi ^a   Terauchi, Hikaru ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b KWANSEI GAKUIN UNIVERSITY   (Japan)

Author keywords

Barium titanate; Dielectric measurement; Multilayer film; Size effect; Strontium titanate; X ray diffraction

Indexed keywords

BARIUM TITANATE; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; FERROELECTRICITY; MOLECULAR BEAM EPITAXY; PEROVSKITE; STRONTIUM COMPOUNDS; THICKNESS MEASUREMENT; ULTRATHIN FILMS; X RAY DIFFRACTION ANALYSIS;

MULTILAYER CAPACITOR; SIZE EFFECT; STRONTIUM TITANATE;

FERROELECTRIC THIN FILMS;

EID: 0035714043     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.6888     Document Type: Article

References (17)