Fine structure of DNA bundles: Atomic force microscopy study

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 12 A, 2001, Pages

  Li, Guanglai ^a,b   Zhang, Yi ^a,b   Li, Bin ^a,b   Hu, Jun ^a,b   Li, Minqian ^a,b  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

APS mica; Atomic force microscope; DNA bundles; Fine structure; Sample preparation

Indexed keywords

ATOMIC FORCE MICROSCOPY; DRYING; MICA; SILANES;

DNA BUNDLES;

DNA;

EID: 0035708330     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l1330     Document Type: Article

References (15)