SCOPUS 정보 검색 플랫폼

Volumn 55, Issue 12, 2001, Pages 1634-1644

Single and double infrared transitions in rapid-vapor-deposited parahydrogen solids: Application to sample thickness determination and quantitative infrared absorption spectroscopy

(2) Tam, Simon a Fajardo, Mario E a

a AIR FORCE RESEARCH LABORATORY (United States)

Author keywords

Matrix isolation spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; HYDROGEN; IMPURITIES; MICROSTRUCTURE; NUMERICAL METHODS; SOLID PROPELLANTS; THICKNESS MEASUREMENT; VAPOR DEPOSITION;

CRYOGENIC PARAHYDROGEN SOLID; HIGH RESOLUTION MATRIX ISOLATION SPECTROSCOPY; INFRARED ABSORPTION SPECTROSCOPY; RAPID VAPOR DEPOSITION; THICKNESS DETERMINATION;

INFRARED SPECTROSCOPY;

EID: 0035701807 PISSN: 00037028 EISSN: None Source Type: Journal
DOI: 10.1366/0003702011953946 Document Type: Article

Times cited : (75)

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