Rapid vapor deposition of millimeters thick optically transparent parahydrogen solids for matrix isolation spectroscopy

Journal of Chemical Physics

Volumn 108, Issue 10, 1998, Pages 4237-4241

  Fajardo, Mario E ^a   Tam, Simon ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; ATOMS; CHARACTERIZATION; CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MOLECULES; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION;

MATRIX ISOLATION SPECTROSCOPY; PARAHYDROGEN; POLYCRYSTALLINE STRUCTURE; RAPID VAPOR DEPOSITION;

HYDROGEN;

EID: 0032495645     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.475822     Document Type: Article

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