Theory of 1/f noise currents in semiconductor devices with one-dimensional geometry and its application to Si Schottky barrier diodes

IEEE Transactions on Electron Devices

Volumn 48, Issue 12, 2001, Pages 2875-2883

  Kim, Jung Sik ^b   Kim, Yong Seok ^b   Min, Hong Shick ^b   Park, Young June ^a,b  

^a IEEE

^b Seoul National University   (South Korea)

Author keywords

1 f noise; Low frequency noise; Schottky barrier diode

Indexed keywords

CURRENT DENSITY; ELECTRON MOBILITY; HOLE MOBILITY; SEMICONDUCTOR DEVICE MODELS; SHORT CIRCUIT CURRENTS; SPURIOUS SIGNAL NOISE;

MOBILITY FLUCTUATION MODELS;

SCHOTTKY BARRIER DIODES;

EID: 0035694111     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.974721     Document Type: Article

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