A fast algorithm for the study of wave-packet scattering at disordered interfaces

VLSI Design

Volumn 13, Issue 1-4, 2001, Pages 199-204

  Barker, J R ^a   Watling, J R ^a   Wilkins, R C W ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Electron transport; Interface roughness scattering; Monte Carlo; Transition rates

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELECTROMAGNETIC WAVE SCATTERING; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; MATHEMATICAL MODELS; MONTE CARLO METHODS;

INTERFACE ROUGHNESS SCATTERING;

MOSFET DEVICES;

EID: 0035692953     PISSN: 1065514X     EISSN: None     Source Type: Journal    
DOI: 10.1155/2001/75462     Document Type: Conference Paper

References (8)