Statistical construction of a representative CAD model from a measured population for RF design applications

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2001, Pages 2079-2082

  Leiker, William ^a   Naishadham, Krishna ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; COMPUTER SOFTWARE; DATA STORAGE EQUIPMENT; OPTIMIZATION;

MEASURED POPULATION; STATISTICAL CONSTRUCTION;

COMPUTER AIDED DESIGN;

EID: 0035689246     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Effects of package parasitics on the performance of SAW filters
2. Including dielectric loss in printed circuit models for improved EMI/EMC predictions
3. Closed-form synthesis of equivalent circuits for SMD inductors incorporating package-induced parasitics
4. Statistical analysis of network analyzer measurements