Making cause-effect cost effective: Low-resolution fault dictionaries

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 278-286

  Lavo, David B ^a   Larrabee, Tracy ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; LOGIC GATES; PROGRAM DIAGNOSTICS;

FAULT DIAGNOSIS;

VLSI CIRCUITS;

EID: 0035687590     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2001.966643     Document Type: Article

References (7)

1. Failure diagnosis of structured VLSI
2. A method of test generation and fault diagnosis in very large combinational circuits
3. Multiple fault diagnosis in combinational circuits based on an effect-cause analysis
4. Full fault dictionary storage based on labeled tree encoding
5. Creating small fault dictionaries
6. Bridging fault diagnosis in the absence of physical information