Statistical circuit simulation with measurement-based active device models: implications for process control and IC manufacturability

Technical Digest - GaAs IC Symposium (Gallium Arsenide Integrated Circuit)

Volumn , Issue , 1995, Pages 124-127

  Root, David E ^a   McGinty, Don ^a   Hughes, Brian ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT MANUFACTURE; OPTIMIZATION; PROCESS CONTROL; SENSITIVITY ANALYSIS; STATISTICAL METHODS; TRANSCONDUCTANCE;

DEVICE PARAMETERS DISTRIBUTION; MEASUREMENT BASED ACTIVE DEVICE MODELS; PINCH OFF VOLTAGE; PROCESS CONTROL MONITORS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0029508240     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)