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Volumn 308-310, Issue , 2001, Pages 321-324
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Incorporation of oxygen or di-hydrogen in silicon monovacancy: Spin-resonance study of defect excited state
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Author keywords
ESR; H; O; SDR; Si; Vacancy
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Indexed keywords
CHARGE CARRIERS;
CRYSTAL DEFECTS;
DEUTERIUM;
ELECTRON ENERGY LEVELS;
ELECTRON IRRADIATION;
HYDROGEN;
LIGHT ABSORPTION;
OXYGEN;
PARAMAGNETIC RESONANCE;
SEMICONDUCTOR DOPING;
SPECTRUM ANALYSIS;
EXCITED STATES;
SEMICONDUCTING SILICON;
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EID: 0035678292
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)00888-2 Document Type: Article |
Times cited : (2)
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References (18)
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