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Volumn 29, Issue 3-4, 2001, Pages 237-244
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Detection of quantitative trait loci for grain yield and yield components across environments in durum wheat
a
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Author keywords
QTL mapping; RFLP; RI lines; Wheat; Yield components
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Indexed keywords
EMBRYOPHYTA;
TRITICUM AESTIVUM;
TRITICUM TURGIDUM SUBSP. DURUM;
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EID: 0035668824
PISSN: 01333720
EISSN: None
Source Type: Journal
DOI: 10.1007/bf03543666 Document Type: Article |
Times cited : (12)
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References (12)
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