Simulation and Modelling of Thin Film θ(ρz) Curves for Electron Probe Microanalysis

X-Ray Spectrometry

Volumn 26, Issue 5, 1997, Pages 279-290

  Chan, A ^a   Brown, J D ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON PROBE MICROANALYSIS;

ELECTRON INCIDENCE; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; ENERGY RANGES; FILM/SUBSTRATE; GENERAL EXPRESSION; MONTE CARLO PROGRAMS; MULTIPLE-SCATTERING; SIMULATION AND MODELING; THIN-FILMS;

THIN FILMS;

EID: 0343998133     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1097-4539(199709)26:5<279::aid-xrs207>3.3.co;2-1     Document Type: Article

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