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Applied Physics A: Materials Science and Processing

Volumn 73, Issue 6, 2001, Pages 737-740

Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation

(6) De Filippo, F a De Lisio, C a Maddalena, P a Lerondel G b Yao, T b Altucci, C a,c

a UNIVERSITY OF NAPLES FEDERICO II (Italy)

b TOHOKU UNIVERSITY (Japan)

c UNIVERSITY OF BASILICATA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; DISSOLUTION; ELECTROCHEMISTRY; HARMONIC ANALYSIS; LASER APPLICATIONS; LASER PULSES; MICROPOROUS MATERIALS; REFLECTOMETERS; SUBSTRATES; SYNCHROTRON RADIATION; ULTRAVIOLET SPECTROMETERS; XENON;

FEMTOSECOND INFRARED LASER; HIGH-ORDER LASER-HARMONIC RADIATION; KRAMERS-KRONIG ANALYSIS; VISIBLE ULTRAVIOLET LIGHT SOURCE;

POROUS SILICON;

EID: 0035575589 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100908 Document Type: Article

Times cited : (9)

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