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Thin Solid Films

Volumn 297, Issue 1-2, 1997, Pages 114-117

Quantitative analysis of the light scattering effect on porous silicon optical measurements

(2) Lerondel G a Romestain, R a

a LIPHY (France)

Author keywords

Interface; Light scattering; Reflectivity; Roughness

Indexed keywords

CALCULATIONS; COMPUTER SIMULATION; CURRENT DENSITY; INTERFACES (MATERIALS); LIGHT SCATTERING; MULTILAYERS; OPTICAL VARIABLES MEASUREMENT; REFLECTION; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

DAVIES-BENNETT THEORY; ENERGY TRANSMISSION; REFLECTION COEFFICIENTS; STANDARD OPTICAL MEASUREMENT;

POROUS SILICON;

EID: 0031117263 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)09366-2 Document Type: Article

Times cited : (21)

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