Optical and structural properties of zinc-oxide thin film deposited by pulsed laser deposition

Materials Research Society Symposium - Proceedings

Volumn 666, Issue , 2001, Pages

  Ohshima, Tamiko ^a   Thareja, Raj K ^a   Yamagata, Yukihiko ^a   Ikegami, Tomoaki ^a   Ebihara, Kenji ^a  

^a KUMAMOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; PRESSURE EFFECTS; PULSED LASER DEPOSITION; SEMICONDUCTOR GROWTH; SILICON; SPECTROPHOTOMETRY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

ELECTRON PROBE MICRO-ANALYZERS;

THIN FILMS;

EID: 0035560293     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-666-f3.20     Document Type: Conference Paper

References (7)