SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 638, Issue , 2001, Pages

Low-field electron emission properties from intrinsic and S-incorporated nanocrystalline carbon thin films grown by hot-filament CVD

(6) Gupta, S a Weiner, B R a Weiss, B L a Morell, G a Johnson, Kenyetta a Oritz, Oscar O a

a UNIVERSITY OF PUERTO RICO (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CATHODES; CHEMICAL VAPOR DEPOSITION; ELECTRON EMISSION; ELECTRONIC STRUCTURE; FILM GROWTH; MICROSTRUCTURE; MIXTURES; MOLYBDENUM; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

ELECTRON FIELD EMISSION (EFE);

THIN FILMS;

EID: 0035558529 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (1)

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