The cost of test

AUTOTESTCON (Proceedings)

Volumn , Issue , 2001, Pages 515-523

  Ambler, Anthony ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Test economics

Indexed keywords

AUTOMATIC TESTING; COST BENEFIT ANALYSIS; COST EFFECTIVENESS; INTEGRATED CIRCUIT TESTING; MAINTAINABILITY; PRINTED CIRCUIT TESTING; SEMICONDUCTOR DEVICE TESTING;

COST OF TEST; TEST ECONOMICS;

DESIGN FOR TESTABILITY;

EID: 0035556843     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Preconceived ideas in test
2. System test optimisation
3. LCCA - Life-cycle cost analysis
4. Effective testability design for the product life-cycle
5. Cost benefits from the application of COTS-based ATE