Effective testability design for the product life-cycle

AUTOTESTCON (Proceedings)

Volumn , Issue , 1999, Pages 607-612

  Riedel, Thorsten ^a   Kaminski, Jens ^a   Wahl, Michael ^a   Ambler, Tony ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; ELECTRONIC EQUIPMENT TESTING; LIFE CYCLE; PRODUCT DESIGN;

PRODUCT LIFE CYCLE; TESTABILITY DESIGN;

DESIGN FOR TESTABILITY;

EID: 0033323218     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)