Self-assembled growth of highly oriented para-sexiphenyl thin films controlled by elastic strain

Materials Research Society Symposium - Proceedings

Volumn 665, Issue , 2001, Pages 145-150

  Andreev, Andrei Yu ^a   Sitter, Helmut ^a   Brabec, Christoph J ^a   Hinterdorfer, Peter ^a   Springholz, Günter ^a   Sariciftci, Niyazi S ^a   Resel, Roland ^a   Plank, Harald ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; FILM GROWTH; SELF ASSEMBLY; STRAIN; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELASTIC STRAIN;

THIN FILMS;

EID: 0035556018     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-665-c5.24     Document Type: Conference Paper

References (10)