메뉴 건너뛰기




Volumn 2, Issue , 2001, Pages 638-645

Beamtest of non-irradiated and irradiated ATLAS SCT microstrip modules at KEK

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); PROTONS; SIGNAL TO NOISE RATIO; SILICON SENSORS;

EID: 0035554543     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (10)
  • 2
    • 0005493421 scopus 로고    scopus 로고
    • ATLAS Inner Detector Technical Design Report, CERN/LHCC/97-17, ATLAS TDR 5, 30 April 1997
  • 3
    • 0005419010 scopus 로고    scopus 로고
    • (1) Testbeam experiment T450, KEK, 10-20 Dec. 1999, (2) Testbeam experiment T478, KEK, 28 Nov.-10 Dec. 2000
    • Unno, Y.1
  • 5
    • 0005421021 scopus 로고    scopus 로고
    • Sensors fabricated by Hamamatsu Photonics, 1126-1, Ichi-no-cho, Hamamatsu-shi 435, Japan
  • 6
    • 0005476557 scopus 로고    scopus 로고
    • DMILL technology, TEMIC Semiconductors, La Chantrerie, F-44306 Nantes, France
  • 8
    • 0034451893 scopus 로고    scopus 로고
    • Design and performance of the ABCD chip for the binary readout of silicon strip detectors in the ATLAS Semiconductor Tracker
    • (2000) IEEE Trans. Nucl. Sci. , vol.47 , pp. 1843-1850
    • Dabrowski, W.1
  • 9
    • 0005507813 scopus 로고    scopus 로고
    • The FR-, VAL-, and CG-modules were prepared by Univ. Freiburg, Univ. Valencia, and CERN-Univ. Geneva, respectively. The rest of the modules were by KEK


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.