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Volumn 2, Issue , 2001, Pages 986-990

Improved sensitivity X-ray detectors for field applications

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENIC EQUIPMENT; FLUORESCENCE; LEAKAGE CURRENTS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; THERMOELECTRICITY; X RAYS;

EID: 0035552817     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (14)
  • 5
    • 0005420443 scopus 로고    scopus 로고
    • PhotCoef by AIC Software Inc. Provides tables, graphs, and data on coefficients
  • 7
    • 0032404455 scopus 로고    scopus 로고
    • Performance of a new Schottky CdTe detector for hard x-ray spectroscopy
    • (1998) SPIE , vol.3446 , pp. 29-37
    • Takahashi, T.1
  • 12
    • 84911882727 scopus 로고    scopus 로고
    • Charge trapping in XR-100T-CZT detectors
    • Amptek Inc. Application Note ANCZT-2 Rev. 1
    • Redus, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.