Development of a two-dimensional evaluation method for thin layers using surface plasmon resonance

Chemistry Letters

Volumn , Issue 12, 2001, Pages 1312-1313

  Otsuki, Soichi ^a   Murai, Kensuke ^a   Yoshikawa, Susumu ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035528556     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.2001.1312     Document Type: Article

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