Hands-on tools for nanotechnology

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 6, 2001, Pages 2717-2722

  Seeger, A ^a   Paulson, S ^b   Falvo, M ^b   Helser, A ^c   Taylor II, R M ^a,b,d   Superfine, R ^b,d   Washburn, S ^b,d  

^a University of North Carolina   (United States)

^b The University of North Carolina at Chapel Hill   (United States)

^c 3rdTech Corp   (United States)

^d UNIVERSITY OF NORTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CARRIER CONCENTRATION; ELECTRIC CONDUCTANCE; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON BEAM LITHOGRAPHY; MECHANICAL PROPERTIES; MECHANICAL VARIABLES MEASUREMENT; SCANNING TUNNELING MICROSCOPY;

ELECTRICAL INTERACTIONS; HANDS-ON TOOL; METAL WIRE CONTACTS;

NANOTECHNOLOGY;

EID: 0035519765     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1412890     Document Type: Article

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