A simple method for measuring the relative permittivity of printed circuit board materials

IEEE Transactions on Electromagnetic Compatibility

Volumn 43, Issue 4, 2001, Pages 515-519

  Namba, Akihiro ^b   Wada, Osami ^a,b   Toyota, Yoshitaka ^b   Fukumoto, Yukihiro ^b   Wang, Zhi Liang ^b   Koga, Ryuji ^a,b   Miyashita, Takuya ^a,b   Watanabe, Tetsushi ^c  

^a IEEE

^b OKAYAMA UNIVERSITY   (Japan)

^c INDUSTRIAL TECHNOLOGY CENTER OF OKAYAMA PREFECTURE   (Japan)

Author keywords

Frequency characteristic; Mode identification; Permittivity measurement; Printed circuit board; Rectangular cavity resonator; Reflection coefficient

Indexed keywords

CAVITY RESONATORS; ELECTRIC NETWORK ANALYZERS; FREQUENCIES; PERMITTIVITY; REFLECTION;

PRINTED CIRCUIT BOARD MATERIALS;

PRINTED CIRCUIT BOARDS;

EID: 0035519366     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.974630     Document Type: Article

References (9)

1. New method for determining the permittivity tensor magnetized ferrites in a wide frequency range
2. Use of Whispering-Gallery modes for complex permittivity determinations of ultra-low-loss dielectric materials
3. An evanescent-mode tester for ceramic dielectric substrates
4. Full-wave analysis of a sprit-cylinder resonator for nondestructive permittivity measurements
5. Improved technique for determining complex permittivity with the transmission/reflection method
6. Analysis of two-port flanged coaxial holder for shielding effectiveness and dielectric measurements of thin films and thin materials
7. Determination of complex permittivity of low-loss dielectrics
8. A probe antenna for in situ measurement of the complex dielectric constant of materials
9. Calculation and measurement of the effective chirality parameter of a composite chiral material over a wide frequency band