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Volumn 17, Issue 6, 2001, Pages 19-28
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Substrate noise analysis identifies potential problems in mixed-signal and RF designs
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Author keywords
[No Author keywords available]
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Indexed keywords
SYSTEM-ON-A-CHIP (SOC);
ALGORITHMS;
AMPLIFIERS (ELECTRONIC);
ANALOG TO DIGITAL CONVERSION;
CROSSTALK;
INTEGRATED CIRCUITS;
MATHEMATICAL MODELS;
SPURIOUS SIGNAL NOISE;
CHIP SCALE PACKAGES;
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EID: 0035517255
PISSN: 87553996
EISSN: None
Source Type: Journal
DOI: 10.1109/101.968913 Document Type: Article |
Times cited : (14)
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References (6)
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