1.55-μm wavelength periodic traveling-wave photodetector fabricated using unitraveling-carrier photodiode structures

Journal of Lightwave Technology

Volumn 19, Issue 11, 2001, Pages 1751-1758

  Hirota, Yukihiro ^b   Ishibashi, Tadao ^a,b   Ito, Hiroshi ^a,b  

^a IEEE

^b NTT CORPORATION   (Japan)

Author keywords

Electrooptical measurements; Impedance matching; Microwave devices; Periodic traveling wave photodetectors; Terminal resistor; Ultrafast electron semiconductor devices; Unitraveling carrier photodiode (UTC PD); Velocity matching; Waveguide structure

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTROOPTICAL EFFECTS; IMPEDANCE MATCHING (ELECTRIC); MICROWAVE DEVICES; MICROWAVES; OPTICAL VARIABLES MEASUREMENT; PHOTODIODES; RESISTORS; SEMICONDUCTOR DEVICES; WAVEGUIDES;

ELECTROOPTICAL MEASUREMENTS; ULTRAFAST ELECTRON-SEMICONDUCTOR DEVICES; UNITRAVELING-CARRIER PHOTODIODE STRUCTURES; VELOCITY MATCHING; WAVEGUIDE STRUCTURE; WAVELENGTH PERIODIC TRAVELING-WAVE PHOTODETECTOR;

PHOTODETECTORS;

EID: 0035509985     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.964077     Document Type: Article

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