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Volumn 398-399, Issue , 2001, Pages 501-506
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Characterisation of chromium nitride films produced by PVD techniques
a a a |
Author keywords
Chromium nitride; Physical vapour deposition (PVD); Raman scattering
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Indexed keywords
CHROMIUM COMPOUNDS;
COATINGS;
CRYSTAL DEFECTS;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
MAGNETRON SPUTTERING;
NITRIDES;
PHYSICAL VAPOR DEPOSITION;
RAMAN SPECTROSCOPY;
SPUTTER DEPOSITION;
STAINLESS STEEL;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
CRYSTAL PHASES;
THIN FILMS;
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EID: 0035506166
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01498-5 Document Type: Conference Paper |
Times cited : (114)
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References (13)
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