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Volumn 233, Issue 1-2, 2001, Pages 269-274
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Effect of hydrolysis on properties of PbZr0.50Ti0.50O3 ferroelectric thin films derived from a modified sol-gel process
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Author keywords
A1. X ray diffraction; B1. perovskites; B2. ferroelectric materials
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
DEPOSITION;
HYDROLYSIS;
SEMICONDUCTING LEAD COMPOUNDS;
SEMICONDUCTING SILICON;
SOL-GELS;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
LEAD ZIRCONATE TITANATE (PZT) FILMS;
FERROELECTRIC THIN FILMS;
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EID: 0035502136
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01541-X Document Type: Article |
Times cited : (7)
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References (15)
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