A real-time electro-optic handy probe using a continuous-wave laser

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 5, 2001, Pages 1076-1080

  Shinagawa, Mitsuru ^a,b   Nagatsuma, Tadao ^a,b   Ohno, Kazuhide ^b   Jin, Yoshito ^b  

^a IEEE   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

Bounce; Contactless IC card; Electro optic effect; Electromagnetic interference (EMI); Emission noise; Eye diagram; High impedance probe; Laser diode (LD)

Indexed keywords

CATHODE RAY OSCILLOSCOPES; DISTRIBUTED FEEDBACK LASERS; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROOPTICAL EFFECTS; FREQUENCY DOMAIN ANALYSIS; LIGHT REFLECTION; PHOTODETECTORS; PROBES; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

CADMIUM TELLURIDE; EMISSION NOISE; EYE DIAGRAMS; HIGH IMPEDANCE PROBE; OPTICAL ISOLATOR; OPTICAL RECEIVER;

CONTINUOUS WAVE LASERS;

EID: 0035483846     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963161     Document Type: Article

References (7)

1. A novel high-impedance probe for multi-gigahertz signal measurement
2. Picosecond electrooptic sampling system
3. An automated electro-optic probing system for ultra-high-speed ICs
4. Balanced dual-detector receiver for optical heterodyne communication at Gbit/s rates
5. Measurement of the resonance frequency of contactless IC cards using an electro-optic-sampling probe
6. Power bus decoupling on multilayer printed circuit boards
7. Electrooptic sensor for near-field measurement