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Volumn 41, Issue 13-14, 2001, Pages 2139-2145
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Accuracy of replica materials when measuring engineering surfaces
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Author keywords
AFM; Interference instrument; Relocation; Replica material; Three dimensional surface topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON BEAMS;
STEEL SHEET;
SURFACE TESTING;
SURFACE TOPOGRAPHY;
TEXTURES;
REPLICA MATERIALS;
SURFACE PARAMETERS;
ROUGHNESS MEASUREMENT;
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EID: 0035479517
PISSN: 08906955
EISSN: None
Source Type: Journal
DOI: 10.1016/S0890-6955(01)00080-3 Document Type: Article |
Times cited : (24)
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References (6)
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