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Volumn 41, Issue 13-14, 2001, Pages 2139-2145

Accuracy of replica materials when measuring engineering surfaces

Author keywords

AFM; Interference instrument; Relocation; Replica material; Three dimensional surface topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; STEEL SHEET; SURFACE TESTING; SURFACE TOPOGRAPHY; TEXTURES;

EID: 0035479517     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0890-6955(01)00080-3     Document Type: Article
Times cited : (24)

References (6)
  • 1
    • 0030196863 scopus 로고    scopus 로고
    • Replica techniques for the study of fracture surfaces and topography study in general
    • (1996) Prakt. Metallogr. , vol.33 , pp. 369-372
    • Eckert, J.D.1
  • 2
    • 0018541542 scopus 로고
    • A comparative study of surface replicas
    • (1979) Wear , vol.57 , pp. 51-61
    • George, A.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.