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Volumn 33, Issue 7, 1996, Pages 369-372

Replica techniques for the study of fracture surfaces and topography study in general;Abdruckverfahren für die untersuchung der oberflächentopographie insbesondere von bruchflächen

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL FILMS; SCANNING ELECTRON MICROSCOPY; SPECIMEN PREPARATION; SURFACE ROUGHNESS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0030196863     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (2)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.