|
|
Volumn 242, Issue 1, 2001, Pages 127-132
|
|
Two-dimensional assemblies of colloidal SiO2 and TiO2 particles prepared by the Langmuir-Blodgett technique
|
|
Author keywords
AFM; Colloidal particle assembly; LB technique; Octadecylamine; SEM; SiO2 particle; TiO2 particle
|
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARRIER CONCENTRATION;
ELECTROSTATICS;
MONOLAYERS;
PARTICLE SIZE ANALYSIS;
PH EFFECTS;
SCANNING ELECTRON MICROSCOPY;
SELF ASSEMBLY;
SILICA;
SUBSTRATES;
TITANIUM DIOXIDE;
COLLOIDAL PARTICLES;
LANGMUIR-BLODGETT TECHNIQUES;
COLLOIDS;
SILICON DIOXIDE;
TITANIUM DIOXIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
COLLOID;
DISPERSION;
ELECTRICITY;
IMAGE ANALYSIS;
MOLECULAR INTERACTION;
PARTICLE SIZE;
PH;
POLYMERIZATION;
PRIORITY JOURNAL;
QUANTITATIVE DIAGNOSIS;
RADIATION DOSE DISTRIBUTION;
SCANNING ELECTRON MICROSCOPY;
SOLID;
SURFACE PROPERTY;
|
|
EID: 0035478904
PISSN: 00219797
EISSN: None
Source Type: Journal
DOI: 10.1006/jcis.2001.7784 Document Type: Article |
|
Times cited : (37)
|
|
References (19)
|
