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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 14, 2001, Pages 1444251-1444256

Thickness dependence of the ground-state properties of thin films of the heavy-fermion compound CeCu6

(5) Groten, D a Van Baarle, G J C a Aarts, J a Nieuwenhuys, G J a Mydosh, J A a

a LEIDEN UNIVERSITY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM; COPPER;

ARTICLE; ELECTRON MICROSCOPY; FILM; OXIDATION; PARTICLE SIZE; PHASE TRANSITION; TEMPERATURE DEPENDENCE; THICKNESS; X RAY DIFFRACTION;

EID: 0035477757 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (8)

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