Non-destructive tester for single event burnout of power diodes

Microelectronics Reliability

Volumn 41, Issue 9-10, 2001, Pages 1725-1729

  Busatto, G ^a   Iannuzzo, F ^a   Velardi, F ^a   Wyss, J ^b  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

^b ECT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUBES; ION BOMBARDMENT; NONDESTRUCTIVE EXAMINATION; POWER ELECTRONICS; WAVEFORM ANALYSIS;

POWER DIODES;

SEMICONDUCTOR DIODES;

EID: 0035456980     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00211-6     Document Type: Article

References (7)

1. J.F.Ziegler, "Terrestrial cosmic rays", IBM J. Res. Develop., Vol. 40 No. 1, January 1996, pp. 19-39.
2. A.E.Waskiewicz, J.W.Groninger, V.H.Strahan, D.M. Long, "Burnout of power MOS transistors with heavy ions of californium-252", IEEE Trans, on NS, vol. NS-33, No. 6, 1986, pp. 1710-1713.
3. S.Kuboyama, S.Matsuda, T.Kanno, T.Ishii, "Mechanism for single event burnout of power MOSFETs and its characterization technique", IEEE Trans, on NS, vol. 39, No. 6, 1992, pp. 1698-1703.
4. E.Normand, J.L.Wert, D.L.Oberg, P.P.Majewsky, P.Voss, S.A.Wender, "Neutron-induced single event burnout in high voltage electronics", IEEE Trans, on NS, vol. 44, No. 6, 1997, pp. 2358-2366.
5. P.Voss, K.H, Maier, W.Meczynski, H.W.Becker, E.Normand, J.L.Wert, D.L.Oberg, P.P.Majewsky, "Irradiation experiments with high-voltage power devices as a possible means to predict failure rates due to cosmic rays", Proc. of ISPSD'97, pp. 169-172.
6. K.H.Maier, A.Denker, P.Voss, H.-W. Becker, "Single event burnout of high-power diodes", proc. SHIM '98.
7. G. Busatto, F. Iannuzzo, J. Wyss, D. Pantano, D. Bisello, "Effects of heavy ions impact on power diodes," Poc. RADECS'99, pp. 205-209, 1999.