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Volumn 41, Issue 9-10, 2001, Pages 1643-1648

Thermal fatigue in solder joints of Ag-Pd and Ag-Pt metallized LTCC modules

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CRACK INITIATION; CRACK PROPAGATION; ELECTRONICS PACKAGING; ENERGY DISPERSIVE SPECTROSCOPY; FATIGUE OF MATERIALS; METALLIZING; MULTILAYERS; PALLADIUM; PLATINUM; PRINTED CIRCUIT BOARDS; SCANNING ELECTRON MICROSCOPY; SILVER; THERMAL CYCLING; THERMAL EFFECTS;

EID: 0035456904     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(01)00163-9     Document Type: Article
Times cited : (14)

References (8)
  • 2
    • 0032049303 scopus 로고    scopus 로고
    • Interactions between silver-palladium metallization and tin-lead-silver solder
    • Li G and Chan Y. Interactions between silver-palladium metallization and tin-lead-silver solder. Phys. Stat. Sol.-A Vol. 166, No. 2 (1998), pp. R13-14.
    • (1998) Phys. Stat. Sol.-A , vol.166 , Issue.2
    • Li, G.1    Chan, Y.2
  • 3
    • 0006905550 scopus 로고
    • Degradation of soldered thick film conductor during thermal cycling
    • Reston, USA
    • Yamada K, Makuta F and Chiba S. Degradation of soldered thick film conductor during thermal cycling. ISHM '92 Proceedings, Reston, USA (1992), pp 725-730.
    • (1992) ISHM '92 Proceedings , pp. 725-730
    • Yamada, K.1    Makuta, F.2    Chiba, S.3
  • 4
    • 0006946446 scopus 로고
    • The thermal-cycled adhesion strength of soldered thick film silver-bearing conductors
    • Reston, USA
    • Needes C and Brown J. The thermal-cycled adhesion strength of soldered thick film silver-bearing conductors. ISHM '89 Proceedings, Reston, USA (1989), pp. 211-219.
    • (1989) ISHM '89 Proceedings , pp. 211-219
    • Needes, C.1    Brown, J.2
  • 8
    • 33847574236 scopus 로고    scopus 로고
    • Evaluation of chip scale packaging using acoustic micro imaging: An overview of applications, limitations and directions for future developments
    • SMT Assoc. Edina, MN, USA
    • Semmens J and Kessler L. Evaluation of Chip Scale Packaging using Acoustic Micro Imaging: An overview of applications, limitations and directions for future developments. PanPac. Microel. Symp. Proc of the Technical Program, SMT Assoc. Edina, MN, USA (1998), pp. 157-164.
    • (1998) PanPac. Microel. Symp. Proc of the Technical Program , pp. 157-164
    • Semmens, J.1    Kessler, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.