Cross-sectional TEM studies of transparent thin multilayers on polymeric substrates utilizing ultramicrotomy

Surface and Coatings Technology

Volumn 115, Issue 1, 1999, Pages 52-56

  Park, Gyeong Su ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Anti reflection film; Anti static multilayer; Conductive film; Transmission electron microscopy; Ultramicrotomy

Indexed keywords

ANTIREFLECTION COATINGS; ANTISTATIC AGENTS; CONDUCTIVE FILMS; MULTILAYERS; POLYMERS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPARENCY;

ULTRAMICROTOMY;

PROTECTIVE COATINGS;

EID: 0032668997     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(99)00160-7     Document Type: Article

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