Electrolytic thin layer scanning tunneling microscope: Fabrication and first results

Microelectronic Engineering

Volumn 41-42, Issue , 1998, Pages 547-550

  Indermuhle P F ^a   Ammann, E ^b   Haring P ^c   Kotz R ^c   Siegenthaler, H ^b   De Rooij, N F ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b UNIVERSITY OF BERN   (Switzerland)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROLYTES; FABRICATION; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

ELECTROLYTIC THIN LAYER STM;

PROBES;

EID: 12844267070     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(98)00128-2     Document Type: Article

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