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Volumn 57-58, Issue , 2001, Pages 819-823

A new '2D to 3D' X-ray lithography technology for gray scale structures

Author keywords

3D structures; AZPN114; Gray scale structures; UVIII; X ray lithography

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; HIGH TEMPERATURE EFFECTS; MICROELECTRONICS;

EID: 0035450889     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(01)00559-7     Document Type: Article
Times cited : (3)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.